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Doped Semiconductors
Examples of sMIM measurements on doped silicon, wide bandgap semiconductors, and other non-linear materials.
Materials Characterization
Example measurements on CNT’s, 2D materials, graphene, Ferroelectrics and, other advanced materials for research and development.
Quantitative Measurements
Examples of quantitative measurements for dielectric number, doping concentration, capacitance, and conductivity of high resistance metallic.
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