Welcome to Prime Nano ScanWave™
PrimeNano ScanWave™ will transform your atomic force microscope (AFM) into the world's highest resolution microscope for electrical measurement.
ScanWave™'s game changing technology accelerates the research and development in diverse domains such as microelectronics, ferroelectrics, industrial materials, and next generation materials like graphene, CNTs, 2D semiconductors, and nano-materials in general. Discover how this technology can be used to help increase your productivity.
Advantages of ScanWave™
Industry's highest sensitivity lets you image the hard stuff. Industry's lowest noise floor lets you see the small stuff.
|Single scan - 6 channels of data
Transform your AFM into a high resolution, nanoscale local electrical property microscope.
Imaging of buried structures underneath the sample surface is possible thanks to the long range nature of sMIM.
|Different materials, simultaneously
Be it conductors, semi-conductors, dielectrics, or insulators, ScanWave™ can handle it all. Different materials, even of different classes, can be imaged in the same scan.
|Minimal Sample Prep Time
Since it is not necessary for the sample to be in a conductive path or under current flow or even for the feature of interest to be exposed, samples can be imaged with minimal prep time.
|No Conductive Path Needed
No ground or conductive path needed to get your electrical characterization.
|Contact and Non-Contact Mode Imaging
Electrical measurements can be made in tapping contact imaging modes, even during force distance curves. However you want to scan, ScanWave™ can get the electrical data you need.
|Easy to Use Software
Scan management and configuration is a bliss.